9625 West 76th Street
Minneapolis, MN 55344
Quantitative Nanoscale Stress Relaxation Characterization
Nanoindentation measurements, when operating under displacement feedback control, enable quantitative stress relaxation measurements to be performed at the nanoscale. During a stress relaxation measurement, an indenter probe is pressed into a material’s surface until it reaches a user-defined displacement. The displacement of the indenter probe is held constant while the force acting on the probe is continually measured. Stress relaxation properties are extracted utilizing the measured decay in force as a function of hold time. The localized nature of nanoindentation enables stress relaxation measurements to be performed on a range of materials, from thin films to individual phases of complex microstructures.
Hysitron’s patented electrostatic transducer technologies provide high-accuracy stress relaxation measurements to be reliably performed at the nanoscale. Cutting-edge control electronics and fast feedback control algorithms provide a stable probe displacement and industry-leading force measuring capabilities. Combined with Hysitron’s in-situ SPM imaging, stress relaxation tests can be positioned within ±10nm of the desired testing location for maximum reliability in test results.