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Transmission Electron Microscopy

Transmission Electron Microscopy | Hysitron, Inc.
Transmission Electron Microscopy | Hysitron, Inc.

Transmission Electron Microscopy

Modern transmission electron microscopes (TEMs) provide imaging capabilities at unprecedented magnifications that are many orders of magnitude beyond what can be accomplished with standard optical microscopes. Angstrom or sub-angstrom resolutions can routinely be achieved for imaging down to the atomic scale. Beyond passively imaging of the sample, the combination of TEM imaging with in-situ mechanical testing opens the door for the observation of a host of mechanical phenomena. 

Hysitron’s PI 95 TEM PicoIndenter® instrument is the first full-fledged depth-sensing indenter capable of direct-observation nanomechanical testing inside a transmission electron microscope. Quantitative load-displacement data is acquired with simultaneous TEM observation of stress induced phenomena such as phase transformations, dislocation bursts, fracture onset, and interfacial failure. Certain test parameters can be determined a priori, such as variations in chemical composition or the presence of preexisting defects in the specimen. In addition to imaging, selected-area diffraction can be used to determine sample orientation and loading direction. The pairing of nanoscale mechanical testing with high resolution TEM imaging gives researchers a powerful tool for investigating deformation mechanisms at their most fundamental level.