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Scanning Probe Microscopy

Scanning Probe Microscopy | Hysitron, Inc.
Scanning Probe Microscopy | Hysitron, Inc.

Nanometer Precision Test Placement Accuracy for Reliable, Quantitative Characterization at the Nanoscale

Hysitron is the pioneer and world-leader in scanning nanoindenters. Scanning Probe Microscopy (SPM) combined with nanomechanical testing provides the ability to rapidly visualize the topography of the surface prior to testing and position the nanoindentation probe on the desired test region with nanoscale precision. Additionally, post-test SPM imaging provides confirmation that the measurement was conducted in the desired testing location and valuable information regarding material deformation behavior.

Hysitron’s proprietary high resolution in-situ SPM imaging utilizes the same probe to conduct topographic imaging as to perform the nanomechanical test. During an SPM image, the nanoindenter probe is raster scanned across the surface of the sample. Hysitron’s patented capacitive transducer attached to a piezo scanner maintains a constant imaging force through a tightly controlled feedback loop.  The sensitivity of Hysitron’s transducer technology enables nano-Newton imaging contact forces, making topographical imaging of soft materials and delicate surface structures possible. Utilizing high-resolution SPM imaging, nanomechanical measurements can be placed within ±10nm of the desired testing location for reliable testing of individual microstructures, phases, and interfaces of material. 

In-Situ SPM Enabled Nanomechanical Test Instruments