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Scanning Electron Microscopy

Scanning Electron Microscopy | Hysitron, Inc.

Scanning Electron Microscopy

Scanning electron microscopes (SEMs) have become a ubiquitous tool for imaging materials at a scale far beyond what can be achieved with an optical microscope. These instruments can be found in nearly every central laboratory and provide a versatile tool for imaging a wide range of materials, often with minimal sample prep required. Secondary electron imaging provides a straightforward method for acquiring high resolution micrographs of the sample surface, nanoscale structures, or small variations in surface morphology.  When combined with nanomechanical testing, the SEM provides a powerful platform for identifying and measuring the strength of various low dimensional materials while observing their deformation in real time.

Hysitron’s line of PI Series 8X SEM PicoIndenter® instruments provides an array of options for in-situ mechanical testing. The standard PI 85 gives reliable, quantitative force and displacement data for mechanical testing on a wide range of materials. The PI 87 features more advanced sample positioning capabilities for combining mechanical testing with focused ion beam milling or additional detectors (EBSD, EDS, etc). Extended range (xR) versions of both systems are also available with an expanded force and displacement ranges.  All systems offer standard nanoindentation testing for the determination of hardness and reduced modulus as well as additional mechanical testing modes such as particle/pillar compression, beam/cantilever bending, and tensile testing.