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TI 980 TriboIndenter

TI 980 TriboIndenter Nanoindenter
TI 980 TriboIndenter | Hysitron, Inc.

TI 980 TriboIndenter®

The World's Most Powerful Nanomechanical & Nanotribological Test System for All Your Material Analysis Needs

The TI 980 TriboIndenter is Hysitron's latest, most advanced nanomechanical test instrument that lies at the intersection of maximum performance, flexibility, reliability, usability, and speed. The TI 980 Nanoindenter is the next-generation of Hysitron's renowned TriboIndenter product family, building upon decades of technological innovation to deliver a new level of extraordinary performance, enhanced capabilities, and ultimate versatility in nanomechanical and nanotribological characterization. 

Keeping You at the Forefront of Materials Discovery and Development

Powered by Hysitron's Performech II Advanced Control Module, the TI 980 Nanoindenter delivers remarkable advances in control and throughput capabilities, testing flexibility, applicability, sensitivity, measurement reliability, and system modularity. The TI 980's powerful base configuration includes quantitative nanoscale-to-microscale indentation, nanoscratch, nanowear, high resolution in-situ Scanning Probe Microscopy imaging, dynamic nanoindentation, and high speed mechanical property mapping, providing a comprehensive understanding of material behavior at the nanoscale.

Optimized Multi-Scale Testing — No Compromises

The TI 980 TriboIndenter provides seamless synchronized measurement with multiple Hysitron transducers, each fully optimized for the measurement at hand. Combined with industry-leading noise floors and ultra-fast feedback loop rates and data acquisition, the TI 980 enables quantitative and reliable characterization to the low end of the nanoscale. The system is configurable to test over 6 orders of magnitude in force and 10 orders of magnitude in displacement for quantitative characterization of nearly any material in any form.

Futureproof Characterization Potential

The TI 980 Nanoindenter was developed with maximum flexibility in mind, knowing your characterization needs today will likely be different in the future. The TI 980 supports the largest range of hybrid and correlative nanomechanical characterization techniques, promising to keep your research and materials development at the forefront of technology. Combined with versatile system control and data analysis software, universal sample mounting options (mechanical, magnetic, and vacuum), and a modular environmental enclosure, the TI 980 will adapt to your future characterization requirements. 

TI 980 TriboIndenter Features:

  • Industry-leading force and displacement noise floors enable quantitative nanomechanical and nanotribological characterization to the low end of the nanoscale
    • Standard Hysitron Capacitive Transducer Noise Floors: 20nN force, 0.1nm Displacement
    • Hysitron's xProbe™ Transducer Noise Floors: 1nN Force, 0.01nm Displacement
  • Performech® II Advanced Control Module with state-of-the-art Digital Signal Processor (DSP) plus Field Programmable Gate Array (FPGA)  architecture
  • Ultra-fast feedback control loops and data acquisition rates reliably track rapid transient events and deliver high speed testing capabilities 
  • Powerful base configuration includes quantitative nanoscale-to-microscale indentation, nanoscratch, nanowear, high resolution in-situ Scanning Probe Microscopy imaging, dynamic nanoindentation, and high speed mechanical property mapping
  • TriboScan™ 10 Control Software delivers maximum testing flexibility for unlimited characterization potential
  • XPM™ Accelerated Property Mapping enables 500x faster nanoindentation for rapid, high-resolution property mapping and statistically significant data sets in a short period of time
  • SPM+ high resolution in-situ Scanning Probe Microscopy imaging enables nanometer precision test placement accuracy and characterization of post-test deformation behavior
  • Powerful multi-sample testing automation and automated system calibration routines
  • Intelligent sample navigation with multi-scale sample imaging and data overlays
  • Multi-layer, custom engineered enclosure and active anti-vibration system delivers exceptional environmental stability for reliable nanoscale characterization
  • Tribo iQ™ software enables adaptable data analysis and reporting, with user-writable analysis modules that are shareable amongst the Hysitron community

Additional TI 980 TriboIndenter Information

Popular TI 980 Upgrade Options:

xSol® Environmental Stage: High Temperature, Low Temperature, Humidity, Atmosphere

Raman SpectroscopyCombined Raman Spectroscopy and Nanomechanical Testing

Modulus Mapping™: Quantitative, High-Resolution Surface Modulus Characterization

nanoECR®: In-Situ Electrical Contact Resistance

TriboAE™: In-Situ Acoustic Emission Monitoring

xProbe: Quantitative Rigid Probe Nanoindentation with AFM Resolution

3D OmniProbe™: Quantitative Indentation and Scratch into the Microscale

MultiRange NanoProbe™: Depth-Sensing Microindentation

xZ 500 Displacement Extended Stage: High-Resolution Extended Displacement Characterization Capabilities 

TriboAnalysis™: Open Architecture Data Analysis and Reporting

TriboImage™: Time Resolved Friction/Wear Mapping

TriboScan™ Professional: Comprehensive Instrument Control Software Package Specifically Developed for the Industrial Market 

iTF: Patented Intrinsic Thin Film Property Models

Closed Loop Scanner: High Precision Scanning Probe Microscopy

Fluorescence Microscopy: Target Testing Regions Tagged by Fluorochromes

TriboImage™Multiple Cycle Wear Testing Under Complete Feedback Control to Further Enable Nanoscale Tribological Research.

150/300mm Wafer Chuck: Mounting of 150mm and 300mm Wafers

Versa Chuck: Versatile Sample Mounting for Multi-user Facilities

Vacuum Chuck: Rapid Sample Mounting Utilizing Vacuum

Automated Probe Changer: Fully Automated Nanomechanical & Nanotribological Probe Change System

Electrochemical Nanoindentation Cell: Nanomechanical testing in fluids with electrochemical capabilities

Cooling/Heating Temperature Control Stages: Temperature control stages for heating and cooling samples during nanomechanical testing and imaging

Test Probes: Nanomechanical and Nanotribological Testing Probes