Quantitative Nanoindentation and Nanoscratch Characterization
Hysitron’s patented two-dimensional capacitive transducer technology enables combined nanoindentation and nanoscratch testing capabilities in a single testing head. The 2D transducer delivers ultra-sensitive force and displacement measurements in both the normal and lateral directions for quantitative nanoscale mechanical and tribological characterization. Operating in scratch mode, the transducer can perform localized friction measurements on individual microstructures, interfaces, and ultra-thin films. Ramped force scratching utilizing the 2D transducer is a common means of quantifying film/substrate interfacial adhesion properties.
2D Transducer Features
- Patented two-dimensional capacitive transducer technology provides highly sensitive nanoindentation and nanoscratch testing capabilities
- Quantitative measurement of friction over the nanoscale to microscale
- Enables rapid interfacial adhesion characterization of thin films and coatings