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PI 88 SEM PicoIndenter

PI 88 SEM PicoIndenter | Hysitron, Inc.
PI 88 SEM PicoIndenter | Hysitron, Inc.

PI 88 SEM PicoIndenter®

Hysitron’s SEM series PicoIndenter instruments are depth-sensing nanomechanical test instruments that can be interfaced with scanning electron microscopes (SEM). With these systems, it is possible to perform quantitative nanomechanical testing while simultaneously imaging with the SEM. Coupling these two techniques allows the researcher to position the probe with extreme accuracy and image the deformation process throughout the test. These stage-mounted systems are designed for exceptional performance in the electron microscope, with vacuum compatible versions of Hysitron’s capacitive sensor technology and electrically conductive probes to prevent sample charging to maintain the highest resolution imaging during testing.

The PI 88 SEM PicoIndenter is Hysitron's comprehensive in-situ nanomechanical test instrument for SEM and FIB/SEM.  Built upon Hysitron’s leading edge capacitive transducer technology, the PI 88 SEM PicoIndenter gives researchers an advanced instrument with powerful capabilities that delivers extraordinary performance and versatility.  The modular design also supports our full suite of testing techniques for future upgradability, now including 800°C heating, scratch testing, 5-axis sample positioning, electrical characterization, dynamic fatigue testing, and an interchangeable extended range (500mN, 150µm) transducer.

Hysitron's PI 88 SEM PicoIndenter Features

  • Quantitative measurement of nanomechanical properties including hardness, stiffness, and elastic modulus
  • performech® Advanced Control Module with 78kHz feedback rate and data acquisition up to 38kHz to capture transient events, such as fracture initiation
  • Futureproof modular design which allows for upgradability to our full suite of testing techniques
  • Unique interchangeable transducer technologies optimized for nano- and micro- scale in-situ mechanical testing regimes
  • 3-axis (X, Y, Z) or 5-axis (X, Y, Z, tilt, rotation) sample positioning stages
  • Load or displacement controlled testing modes for nanoindentation, compression, tension, or bending tests
  • Patented Q-Control mode actively dampens transducer oscillations for superior stability
  • Interchangeable probes available in a variety of geometries to meet the demands of different test types

Additional PI 88 SEM PicoIndenter Information

PI 88 SEM PicoIndenter Upgrade Options

Add heating capabilities for direct measurement and observation of thermally initiated material transformations, ideal for testing materials that demand reliability under extreme conditions. Learn More

Add testing capabilities for simultaneous measurement of electrical and mechanical properties during nanoindentation, compression, or tensile loading to understand origins of electrical property changes in materials or devices. Learn More

Nanowires and free standing thin films can be mounted and tested in tension using these MEMS fabricated devices. An electrical version of the device further expands the capabilities and enables four point electrical measurements throughout the tensile experiment. Learn More

Apply an oscillating force to continuously measure viscoelastic and fatigue properties as a function of contact depth, frequency, and time. Learn More

In-situ tribology sheds light on deformation processes occurring at the sliding interface. Friction properties can be measured while wear evolution is directly viewed. Learn More