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PI 85L SEM PicoIndenter

PI 85L SEM PicoIndenter | Hysitron, Inc.
PI 85L SEM PicoIndenter | Hysitron, Inc.

PI 85L SEM PicoIndenter®

Hysitron’s SEM series PicoIndenter instruments are depth-sensing nanomechanical test instruments that can be interfaced with scanning electron microscopes (SEM). With these systems, it is possible to perform quantitative nanomechanical testing while simultaneously imaging with the SEM. Coupling these two techniques allows the researcher to position the probe with extreme accuracy and image the deformation process throughout the test. These stage-mounted systems are designed for exceptional performance in the electron microscope, with vacuum compatible versions of Hysitron’s capacitive sensor technology and electrically conductive probes to prevent sample charging to maintain the highest resolution imaging during testing.

The PI 85L SEM PicoIndenter is the next-generation version of our dedicated in-situ nanomechanical test instrument, designed for use in SEM but suitable for a variety of platforms and environments.  Featuring Hysitron’s capacitive transducer working in conjunction with an extremely fast 78kHz control system, the system provides exceptional performance and superior stability at nanoscale.  The compact, low profile design makes the system ideally suited for small chamber SEMs, Raman and optical microscopes, beamlines, and more.

Hysitron's PI 85L SEM PicoIndenter Features

  • Quantitative measurement of nanomechanical properties including hardness, stiffness, and elastic modulus
  • performech® Advanced Control Module with 78kHz feedback rate and data acquisition up to 38kHz to capture transient events, such as fracture initiation
  • Low profile design ideal for SEMs, Raman and optical microscopes, beamlines, and more
  • Hysitron’s unique transducer technology featuring electrostatic actuation and capacitive displacement sensing
  • Load or displacement controlled testing modes for nanoindentation, compression, tension, or bending tests
  • Patented Q-Control mode actively dampens transducer oscillations for superior stability
  • Interchangeable probes available in a variety of geometries to meet the demands of different test types

Additional PI 85L SEM PicoIndenter Information

PI 85L SEM PicoIndenter Upgrade Options

Add heating capabilities for direct measurement and observation of thermally initiated material transformations, ideal for testing materials that demand reliability under extreme conditions. Learn More

Add testing capabilities for simultaneous measurement of electrical and mechanical properties during nanoindentation, compression, or tensile loading to understand origins of electrical property changes in materials or devices. Learn More

Nanowires and free standing thin films can be mounted and tested in tension using these MEMS fabricated devices. An electrical version of the device further expands the capabilities and enables four point electrical measurements throughout the tensile experiment. Learn More

Apply an oscillating force to continuously measure viscoelastic and fatigue properties as a function of contact depth, frequency, and time. Learn More