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Hysitron TriboScope

Hysitron TriboScope | Bruker
Hysitron TriboScope | Bruker

Hysitron TriboScope

Enhance the Characterization Capabilities of Your AFM

Bruker’s Hysitron TriboScope® delivers quantitative, rigid-probe nanoindentation and nanotribological characterization capabilities to the world of Atomic Force Microscopy. The Hysitron TriboScope interfaces with Bruker’s Dimension Icon, Dimension Edge, and MultiMode 8 AFMs to expand the characterization capabilities of these microscopes. Utilizing a rigid test probe, the TriboScope removes the limitations, variability, and complexity associated with cantilever-based mechanical and tribological property measurements.

TriboScope Features

  • Quantitative, rigid-probe characterization removes the uncertainties and complexities intrinsically caused by cantilever-based nanoindentation and nanotribological testing techniques
  • Measurement of elastic modulus, hardness, creep, stress relaxation, fracture toughness, etc over the nanometer to micrometer length scales
  • Streamlined integration with popular commercially available AFMs, Including Bruker’s Dimension Icon, Dimension Edge, and MultiMode 8
  • Proprietary capacitive transducer and Performech® control technologies provide superior control over the nanoindentation process and deliver industry-leading force and displacement noise floors
  • In-situ SPM imaging provides nanometer precision test placement accuracy and observation of post-test material deformation behavior
  • Enables quantitative nanomechanical characterization of the broadest range of materials, from soft polymers to ultra-thin diamond thin films

Quantitative, Reliable, and Repeatable Characterization

Bruker’s Hysitron TriboScope utilizes proprietary electrostatic force actuation and capacitive displacement sensing transducer technology to enable nanomechanical and nanotribological testing on commercially available AFMs. The compact transducer design replaces the SPM detector assembly and is easily interfaced with most commercially available AFM systems within minutes. The transducer utilizes a rigid test probe, which unlike cantilever-based systems, provides a direct measurement of probe force and displacement and does not rely on measuring cantilever stiffness and flexure.

The TriboScope is driven by the Performech advanced control module, providing unsurpassed testing performance and industry-leading sensitivity. The system operates under closed loop force or displacement control modes for superior control over the nanoindentation process. TriboScope systems also provide in-situ SPM imaging capabilities obtained by raster scanning the test probe over the sample surface and enables measurement placement to within 10nm of the desired testing location. The quantitative force and displacement results acquired during the test, in conjunction with the in-situ imaging capability, offer an unparalleled wealth of information concerning the material deformation behavior and mechanical properties at the nanoscale.

Additional TriboScope Information

nanoDMA® III: Nanoscale Dynamic Mechanical Analysis

2D Transducer: Combined Nanomechanical and Nanotribological Characterization

Nanomechanical Testing Probes: Nanomechanical and Nanotribological Testing Probes