TEM or SEM imaging is used to verify proper tip alignment and quantitatively evaluate size/strength relationships of nano and micro sized particles for potential use as components in engineered composite materials.
Low Dimensional Materials
Low dimensional materials are those that have at least one dimension small enough for the physical properties of the material lay somewhere between that of individual atoms and the bulk material. The dimensional constraints of nanoparticles, graphene, nanopillars, and nanofibers/tubes result in a large surface area to volume ratio that allows surface states and small structural details to dominate their physical response to mechanical deformation. The importance of in-situ visualization during the test is critical for proper test positioning accuracy as well as the ability to optically correlate sample geometry and real-time deformation behavior to the stress-strain response of the material.
Hysitron has developed multiple innovative technologies to accelerate the understanding of low dimensional materials. Combining the strengths of electron microscopy (TEM, SEM) and nanomechanical testing techniques, one can achieve new insights into how to control matter on the nanoscale.
Seeing is Believing® - Nanomechanics of Low Dimensional Materials
Mechanical characterization of atomic monolayers inherently requires extremely high force sensitivity. A variety of techniques can be used to measure the extraordinary mechanical and electromechanical properties of these 2D materials.
Stress is applied to induce compression or bending while deformation is monitored in real time. Known specimen dimensions enable the straightforward determination of stress/strain, yield strength, and fracture toughness.
Measuring tensile properties of 1D materials requires extremely high force sensitivity as well as stringent sample preparation techniques. Hysitron has developed novel methods for the mounting, testing, and analysis of these challenging materials.