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PI 85 SEM PicoIndenter®

PI 85 SEM PicoIndenter | Scanning Electron Microscope

The PI 85 SEM PicoIndenter is a depth-sensing indenter that can be interfaced with a scanning electron microscope (SEM). With this system it is possible to perform quantitative nanomechanical testing while simultaneously imaging with the scanning electron microscope. Coupling these two techniques allows the researcher to position the probe with extreme accuracy and to image the deformation process throughout the test.

This system is designed for exceptional performance in the electron microscope, with a vacuum-compatible transducer and a conductive boron-doped diamond probe. With Hysitron's 3-plate capacitive transducer, force is applied electrostatically and displacement is measured capacitively. This low-current design provides low thermal drift and industry-leading stability and sensitivity.

The PI 85 system is ideal for characterizing fracture onset and crack propagation, delamination, and pile-up. Also, time-sensitive phenomena such as viscoelastic behavior can be observed in real time rather than "post mortem." The pairing of these two high-resolution techniques provides unique insight into the mechanisms responsible for materials behavior.


Compatible Options & Upgrades:

pdf  Hybrid Techniques for In Situ Nanomechanics Information Sheet

pdf  nanoDMA® PI Information Sheet

pdf  Push-to-Pull Device Information Sheet

 
Additional Information on the PI 85 SEM PicoIndenter:

pdf  PI 85 SEM PicoIndenter Information Sheet

pdf  performech Controller with TriboScan™9 Information Sheet

pdf  PicoIndenter Video Integration Information Sheet

pdf  PI Series Legal Notice