AFM Imaging
The instrument in-situ SPM imaging capabilities can be expanded by adding a dedicated atomic force microscope to any TI 900 or TI 950 TriboIndenter system.
The AFM Imaging option provides a lower contact force, higher sensitivity and increased resolution imaging option for TI 900 and TI 950 TriboIndenter systems. The lower contact force, sharper probe and increased resolution makes the AFM Imaging upgrade ideal for identifying fine features or imaging soft materials.
The AFM Imaging option builds upon the existing capabilities of the Hysitron system to offer an array of additional features. Integrated seamlessly into the TI 900 and TI 950 TriboIndenter systems, the easy-to-use software interface allows for smooth transitions from nanoindentation testing to AFM imaging.
The AFM Imaging option comes standard with contact and non-contact imaging modes. The AFM Imaging option can be upgraded to perform magnetic force microscopy (MFM) imaging.
