NEW nanoDMA^® III

Hysitron's nanoDMA III is a powerful new dynamic testing technique used to perform nanoscale mechanical property measurements. nanoDMA III is equipped with newly developed CMX control algorithms to provide a truly continuous measurement of mechanical properties as a function of depth into a material's surface. High bandwidth transducer and control electronics are fully optimized for nanoscale dynamic testing and provide industry-leading performance, sensitivity, and a broad dynamic range. Hysitron's unique coupled AC/DC force modulation routine enables true nanoscale mechanical characterization and is not subjected to the slow feedback response times that plague other nanoscale dynamic stiffness techniques. TriboScan v.9 control software incorporates an intuitive graphical user interface to speed test setup and execution, enhanced data analysis and plotting capabilities, and in-situ drift correction capabilities for accurate results during long test durations.

A CMX depth profile on (100) Aluminum from 2nm - 110nm. Discontinuities in the data are due to dislocation bursts occuring during the nanomechanical test.	0.1Hz - 200Hz frequency sweeps on various polymers utilizing the reference frequency technique. Note the beta transition seen on PMMA as indicated by the small tan-delta peak near 10Hz.
Modulus and hardness as a function of contact depth from multiple tests on (A) fused quartz, (B) low-κ film. Each curve is comprised of 3000 individual data points taken in 30 seconds.	1 hour creep test on copper and cement using the reference frequency creep testing technique.

Hysitron's nanoDMA III features:

Newly developed CMX algorithms, providing a truly Continuous Measurement of X (X = hardness, storage modulus, loss modulus, complex modulus, tan-delta, etc.) as a function of contact depth, frequency and time
Universally applicable technique for the thorough nanoscale characterization materials, from ultra-soft hydrogels to hard coatings
High bandwidth electronics for a greatly improved signal to noise ratio and faster testing cycles
Enhanced dynamic characteristics and dynamic testing range (0.1Hz to 300Hz), enabling increased accuracy and applicability on the broadest range of materials
Flexible graphical user interface for rapid test setup, execution, and increased data analysis and reporting capabilities
Coupled AC and DC force modulation for reliable and quantitative nanoscale dynamic characterization from the initial surface contact
Automated testing routines for increased sample throughput
In-situ drift correction capabilities for maximum accuracy during long test cycles

TI 950 TriboIndenter	TI 900 TriboIndenter	TI 750 Ubi
TS 75 TriboScope

	PDF (1.8 MB)	nanoDMA III Information Sheet
	PDF (0.4 MB)	Temperature and Frequency Dependence in PMMA

NEW nanoDMA® III

NEW nanoDMA^® III