The in-situ SPM imaging capabilities (standard on most Hysitron instruments) can be expanded by adding a dedicated atomic force microscope to any TI 900 or TI 950 TriboIndenter^® system.

The AFM Imaging option provides a lower contact force, higher sensitivity and increased resolution imaging option for the TI 900 and TI 950 TriboIndenter systems. The lower contact force, sharper probe and increased resolution makes the AFM Imaging upgrade ideal for identifying fine features or imaging soft materials.

The AFM Imaging option builds upon the existing capabilities of the Hysitron system to offer an array of additional features. Integrated seamlessly into the TI 900 and TI 950 TriboIndenter systems, the easy-to-use software interface allows for smooth transitions from nanoindentation testing to AFM imaging.

The AFM Imaging option comes standard with contact and non-contact imaging modes. The AFM Imaging option can be upgraded to perform magnetic force microscopy (MFM) imaging.

The Hysitron AFM Imaging upgrade features:

• Fully integrated system offers seamless transitions from nanoindentation to AFM imaging
  
• Use of low imaging contact forces, intermittent contact and phase imaging modes results in non-destructive sample imaging
  
• Dedicated computer system with acquisition and analysis software
  
• 22,500 mm2 testing area available for AFM imaging, nanoindentation and optical imaging
  
• Nine rendering modes and advanced color pallets
  
• Specially designed sample stage
  
• Z-axis range of 4.5 μm
  
• Z-axis resolution of 0.7 Å
  
• X -axis scan range of 40 μm
  
• Y-axis scan range of 40 μm
  
• X/Y-axis resolution of 7 Å