Advanced Techniques
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nanoECR®
nanoscale Electrical Contact Resistance for simultaneous in-situ electrical and nanomechanical characterization.
Now available with conductive imaging.
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nanoDMA® III
nanoscale Dynamic Mechanical Analysis with CMX incorporates powerful new electronics and control algorithms to obtain a
truly continuous measurement of mechanical properties as a function of indentation depth, frequency, and time.
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TriboAE™ Acoustic Emission Testing
Obtain acoustic emission signals resulting from material deformation, fracture, and delamination during
nanoindentation experiments.
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performech™
Provides superior control over the nanomechanical test with industry-leading sensitivity (<30nN force noise floor), an ultra-
fast feedback control loop (78kHz), and fast data acquisition rate (39kHz).
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performech Packages
Hysitron has assembled our most popular performech + technique combinations at package pricing to advance your current
and future research capabilities.
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Stages
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XZ-500 Extended Displacement Stage
Provides indentation depths up to 500µm for enhanced flexibility and accuracy in testing ultra-soft and compliant materials.
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Vacuum Stages
Multiple vacuum stage designs are available to securely and easily mount samples inside the nanomechanical
test instrument.
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Temperature Control Stages
Heating or heating/cooling stages for investigation of mechanical properties at, or near, a material's operating temperature.
Temperatures range from -10° to >400°.
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Mapping/Imaging
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Closed Loop Scanners
Closed Loop SPM imaging providing an increased scan range (X-Y: 100µm, Z: 15µm) with extremely low scanner bow and a
linearity of greater than 99.95%.
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Modulus Mapping™
Quanititatively map the storage and loss stiffness and moduli with high spatial resolution using Hysitron's patented
SPM imaging.
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TriboImage™
Multiple cycle wear testing under complete feedback control to further enable nanoscale tribological research.
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Fluorescence Microscopy
Provides the ability to reliably and seamlessly position nanomechanical tests on specific areas of the sample that have been
marked with fluorochromes.
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AFM Imaging
Lower contact force, higher sensitivity and increased resolution imaging, which is ideal for identifying fine features or
imaging soft materials. High resolution, low contact force imaging for identifying fine surface features and imaging
soft materials.
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Testing Heads
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3D OmniProbe™
The three-dimensional force-displacement sensing and control technologies integrate indentation and scratch testing
techniques into a single transducer to provide nanoscale to microscale mechanical property and tribological characterization.
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MultiRange NanoProbe™
Utilizes cutting-edge piezoelectric load cell in combination with Hysitron's reliable capacitive sensor technology to provide
unparalleled results over decades of probe force and displacement for quantitative mechanical properties from the
nanoscale into the microscale.
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RAPIDprobe™
MEMS transducer providing increased sensitivity, a higher mechanical bandwidth, and faster in-situ SPM imaging.
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2D Capacitive Transducer
Hysitron's patented capacitive transducer technology capable of performing both nanoindentation and nanoscratch testing.
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Software/Data Analysis/Training
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TriboAnalysis™
Open architecture data analysis and plotting software powered by Origin Pro.
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TriboScan™ Professional
Comprehensive instrument control software package specifically developed for the industrial market. Streamlined system
operation combined with a multi-user level software architecture and automated test routines, calibration, data analysis,
and data reporting capabilities greatly reduce the cost of ownership for nanomechanical instrumentation.
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TriboScan™
Fully integrated nanomechanical test instrument control and data analysis software package.
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Knowledge Base Resources
Offers continuous training with best practices for both new and experienced users, including: in-depth training videos,
customer support center website, industry-leading technical support, and training by Hysitron's customer service engineers. |